1534 search results - page 36 / 307 » Error Reporting Logic |
IOLTS
2007
IEEE
15 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
ICCD
2008
IEEE
15 years 6 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
ISQED
2007
IEEE
15 years 4 months ago
2007
IEEE
Parameter variation in integrated circuits causes sections of a chip to be slower than others. To prevent any resulting timing errors, designers have traditionally designed for th...
AGIS
2000
14 years 9 months ago
2000
Following a brief discussion on various aspects of data quality, possible methods are examined for the detection of errors in a spatial database. Using examples, we introduce the c...
ACL
2011
14 years 1 months ago
2011
Despite the rising interest in developing grammatical error detection systems for non-native speakers of English, progress in the field has been hampered by a lack of informative...