322 search results - page 7 / 65 » Estimation of the mean lifetime from vague data |
COLING
1996
14 years 11 months ago
1996
This paper studies the computational complexity of disambiguation under probabilistic tree-grammars as in (Bod, 1992; Schabes and Waters, 1993). It presents a proof that the follo...
MICRO
2010
IEEE
14 years 7 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
DAC
2007
ACM
15 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
WSC
2008
15 years 6 days ago
2008
We formulate and evaluate distribution-free statistical process control (SPC) charts for monitoring an autocorrelated process when a training data set is used to estimate the marg...
EMNLP
2010
14 years 7 months ago
2010
This paper addresses the problem of learning to map sentences to logical form, given training data consisting of natural language sentences paired with logical representations of ...