We propose a variance-component probabilistic model for sparse signal reconstruction and model selection. The measurements follow an underdetermined linear model, where the unknown...
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Abstract—This paper aims at validation of an iterative receiver for Multiple-Input Multiple-Output with Orthogonal Frequency Division Multiplexing (MIMO-OFDM) systems using real-...
Pierluigi Salvo Rossi, Peter Hammarberg, Fredrik T...
Limiting capabilities of practical recognition systems are determined by a variety of factors that include source encoding techniques, quality of images, complexity of underlying ...
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar