40 search results - page 2 / 8 » Evaluating coverage of error detection logic for soft errors... |
CASES
2006
ACM
13 years 10 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
PATMOS
2007
Springer
14 years 11 days ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 6 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
ASPLOS
2004
ACM
13 years 11 months ago
2004
ACM
Recent studies have suggested that the soft-error rate in microprocessor logic will become a reliability concern by 2010. This paper proposes an efficient error detection techniqu...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...