215 search results - page 1 / 43 » Evaluation of the statistical delay quality model |
ASPDAC
2005
ACM
15 years 1 months ago
2005
ACM
VTS
2007
IEEE
15 years 5 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
DATE
2003
IEEE
15 years 4 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
VTS
2003
IEEE
15 years 4 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
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ICCAD
2003
IEEE
15 years 8 months ago
2003
IEEE
This paper proposes a model for calculating statistical gate-delay variation caused by intra-chip and inter-chip variability. As the variation of individual gate delays directly i...