215 search results - page 7 / 43 » Evaluation of the statistical delay quality model |
VTC
2007
IEEE
15 years 3 months ago
2007
IEEE
—This paper reviews the pertinence and statistical behavior of symbol-spaced tapped-delay-line (TDL) models which are widely used to model wide-sense stationary uncorrelated scat...
ISSRE
2008
IEEE
15 years 4 months ago
2008
IEEE
Prediction of fault prone software components is one of the most researched problems in software engineering. Many statistical techniques have been proposed but there is no consen...
90
Voted
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
102
click to vote
ATS
2010
IEEE
14 years 7 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
DPHOTO
2010
14 years 11 months ago
2010
We describe the procedure to evaluate the image quality of a camera in terms of texture preservation. We use a stochastic model coming from stochastic geometry, and known as the d...