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DAC
2007
ACM
16 years 5 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2005
ACM
16 years 5 months ago
Energy optimal speed control of devices with discrete speed sets
We obtain analytically, the energy optimal speed profile of a generic multi-speed device with a discrete set of speeds, to execute a given task within a given time. Current implem...
Ravishankar Rao, Sarma B. K. Vrudhula
DAC
2005
ACM
16 years 5 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
ICDT
2009
ACM
147views Database» more  ICDT 2009»
16 years 5 months ago
The average-case complexity of counting distinct elements
We continue the study of approximating the number of distinct elements in a data stream of length n to within a (1? ) factor. It is known that if the stream may consist of arbitra...
David P. Woodruff
WWW
2007
ACM
16 years 5 months ago
Open user profiles for adaptive news systems: help or harm?
Over the last five years, a range of projects have focused on progressively more elaborated techniques for adaptive news delivery. However, the adaptation process in these systems...
Jae-wook Ahn, Peter Brusilovsky, Jonathan Grady, D...
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