469 search results - page 18 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
101
Voted
KBSE
2002
IEEE
15 years 5 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...
96
Voted
DATE
2000
IEEE
15 years 4 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
99
Voted
DAC
1994
ACM
15 years 4 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
82
Voted
ITC
1997
IEEE
15 years 4 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...