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ETS
2011
IEEE
212views Hardware» more  ETS 2011»
14 years 2 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J...
OOPSLA
2005
Springer
15 years 8 months ago
AutAT: an eclipse plugin for automatic acceptance testing of web applications
In this paper we describe AutAT, an open source Eclipse plugin to better enable test driven development of web applications. AutAT lets non-technical people write acceptance tests...
Christian Schwarz, Stein Kåre Skytteren, Tro...
ISQED
2000
IEEE
131views Hardware» more  ISQED 2000»
15 years 7 months ago
Low Power Testing of VLSI Circuits: Problems and Solutions
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Patrick Girard
ADAEUROPE
1997
Springer
15 years 7 months ago
Systematic Unit-Testing of Ada Programs
The systematic test is an inevitable part of the verification and validation process for software. Overall support for all testing activities is currently not available in a singl...
Joachim Wegener, Ines Fey
CORR
2006
Springer
123views Education» more  CORR 2006»
15 years 3 months ago
Continuations, proofs and tests
Continuation Passing Style (CPS) is one of the most important issues in the field of functional programming languages, and the quest for a primitive notion of types for continuati...
Stefano Guerrini, Andrea Masini