4167 search results - page 208 / 834 » Evolutionary functional testing |
132
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ICCAD
1994
IEEE
15 years 7 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
106
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ASPDAC
2006
ACM
15 years 9 months ago
2006
ACM
Abstract— An efficient algorithm for three-dimensional (3D) capacitance extraction on multi-layered and lossy substrate is presented. The new algorithm represents a major improv...
122
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DATE
2007
IEEE
15 years 9 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
117
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SIGSOFT
2005
ACM
16 years 3 months ago
2005
ACM
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
163
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ECCC
2011
14 years 10 months ago
2011
We develop a new technique for proving lower bounds in property testing, by showing a strong connection between testing and communication complexity. We give a simple scheme for r...