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119
Voted
ICES
2010
Springer
15 years 1 months ago
2010
Springer
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
157
Voted
FLAIRS
2009
15 years 1 months ago
2009
Empirical testing is a very popular evaluation method for the development of intelligent systems. Here, previously solved problems with correct solutions are given as cases to the...
121
Voted
APSEC
2010
IEEE
14 years 10 months ago
2010
IEEE
Abstract--Real-time embedded systems (RTESs) are becoming increasingly ubiquitous, controlling a wide variety of popular and safety-critical devices. Effective testing techniques c...
120
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STOC
2003
ACM
16 years 3 months ago
2003
ACM
Let H be a fixed directed graph on h vertices, let G be a directed graph on n vertices and suppose that at least n2 edges have to be deleted from it to make it H-free. We show tha...
124
Voted
VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...