4167 search results - page 271 / 834 » Evolutionary functional testing |
147
Voted
DATE
1999
IEEE
15 years 8 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
136
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VLSID
1993
IEEE
15 years 7 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
139
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DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
164
Voted
DATE
2002
IEEE
15 years 8 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
121
Voted
ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...