4167 search results - page 283 / 834 » Evolutionary functional testing |
138
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ASPDAC
2004
ACM
15 years 9 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
127
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DFT
2003
IEEE
15 years 9 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
135
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ISSRE
2002
IEEE
15 years 8 months ago
2002
IEEE
In this paper, based on software reliability growth models with generalized logistic testing-effort function, we study three optimal resource allocation problems in modular softwa...
135
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VTS
2002
IEEE
15 years 8 months ago
2002
IEEE
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
144
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VTS
2002
IEEE
15 years 8 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...