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ITC
2003
IEEE
136views Hardware» more  ITC 2003»
15 years 9 months ago
Adapting JTAG for AC Interconnect Testing
The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that h...
Lee Whetsel
BMCBI
2006
148views more  BMCBI 2006»
15 years 4 months ago
Exploiting the full power of temporal gene expression profiling through a new statistical test: Application to the analysis of m
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...
Veronica Vinciotti, Xiaohui Liu, Rolf Turk, Emile ...
DAC
2007
ACM
16 years 5 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
PG
2007
IEEE
15 years 10 months ago
Statistical Hypothesis Testing for Assessing Monte Carlo Estimators: Applications to Image Synthesis
Image synthesis algorithms are commonly compared on the basis of running times and/or perceived quality of the generated images. In the case of Monte Carlo techniques, assessment ...
Kartic Subr, James Arvo
126
Voted
EDO
2005
Springer
15 years 9 months ago
Experiences in coverage testing of a Java middleware
This paper addresses the issues of test coverage analysis of J2EE servers. These middleware are nowadays at the core of the modern information technology’s landscape. They provi...
Mehdi Kessis, Yves Ledru, Gérard Vandome