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DATE
2009
IEEE
115views Hardware» more  DATE 2009»
15 years 11 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
VTS
1996
IEEE
111views Hardware» more  VTS 1996»
15 years 8 months ago
Synthesis-for-scan and scan chain ordering
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
Robert B. Norwood, Edward J. McCluskey
SIGGRAPH
1994
ACM
15 years 8 months ago
Predicting the drape of woven cloth using interacting particles
We demonstrate a physically-based technique for predicting the drape of a wide variety of woven fabrics. The approach exploits a theoretical model that explicitly represents the m...
David E. Breen, Donald H. House, Michael J. Wozny
ICMLA
2008
15 years 6 months ago
Target Selection: A New Learning Paradigm and Its Application to Genetic Association Studies
In this work, a new learning paradigm called target selection is proposed, which can be used to test for associations between a single genetic variable and a multidimensional, qua...
Johannes Mohr, Sambu Seo, Imke Puis, Andreas Heinz...
BMCBI
2006
156views more  BMCBI 2006»
15 years 4 months ago
Score-based prediction of genomic islands in prokaryotic genomes using hidden Markov models
Background: Horizontal gene transfer (HGT) is considered a strong evolutionary force shaping the content of microbial genomes in a substantial manner. It is the difference in spee...
Stephan Waack, Oliver Keller, Roman Asper, Thomas ...