As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breue...
Rendering high-quality shadows in real-time is a challenging problem. Shadow mapping has proved to be an efficient solution, as it scales well for complex scenes. However, it suff...
Thomas Annen, Tom Mertens, Hans-Peter Seidel, Eddy...
In this paper we present an average-case analysis of the nearest neighbor algorithm, a simple induction method that has been studied by manyresearchers. Our analysis assumes a con...
An auditory-based feature extraction algorithm is presented. The feature is based on a recently published time-frequency transform plus a set of modules to simulate the signal pro...