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136
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GLVLSI
2006
IEEE
15 years 11 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
144
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ICSM
2005
IEEE
15 years 10 months ago
2005
IEEE
Crisp is a tool (i.e., an Eclipse plug-in) for constructing intermediate versions of a Java program that is being edited in an IDE such as Eclipse. After a long editing session, a...
134
Voted
CEC
2009
IEEE
15 years 9 months ago
2009
IEEE
— Many real-world dynamic optimisation problems have constraints, and in certain cases not only the objective function changes over time, but the constraints also change as well....
131
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ITC
1996
IEEE
15 years 9 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
137
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GECCO
2007
Springer
15 years 8 months ago
2007
Springer
In this research, we compare four different evaluation methods in coevolution on the Majority Function problem. The size of the problem is selected such that an evaluation against...