4167 search results - page 453 / 834 » Evolutionary functional testing |
115
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ICCAD
2000
IEEE
15 years 9 months ago
2000
IEEE
The Charge Sharing (CS) problem is one of notorious noise problems in domino circuits design and test. In this paper, this problem is thoroughly investigated by considering circui...
109
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ICMCS
2000
IEEE
15 years 9 months ago
2000
IEEE
In this paper, a system for automatic albuming of consumer photographs is described, and its specific core components of event segmentation and screening of low quality images are...
131
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VTS
2000
IEEE
15 years 9 months ago
2000
IEEE
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-leve...
120
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GLVLSI
1999
IEEE
15 years 9 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
138
Voted
SIGIR
1999
ACM
15 years 9 months ago
1999
ACM
This paper reports a controlled study with statistical signi cance tests on ve text categorization methods: the Support Vector Machines (SVM), a k-Nearest Neighbor (kNN) classi er...