4167 search results - page 69 / 834 » Evolutionary functional testing |
GLVLSI
2007
IEEE
15 years 6 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
ERSHOV
2009
Springer
15 years 6 months ago
2009
Springer
Abstract. The article concerns problems of formulating standard requirements to implementations of mathematical functions working with floating-point numbers and conformance test ...
DATE
1998
IEEE
15 years 4 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
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SAFECOMP
2005
Springer
15 years 5 months ago
2005
Springer
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
DAC
1994
ACM
15 years 4 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...