122 search results - page 2 / 25 » Evolvable Hardware for the Generation of Sequential Filter C... |
EH
2003
IEEE
13 years 11 months ago
2003
IEEE
The evolution of circuits with on-line built-in self-test is attempted in simulation for a full adder, a two bit multiplier and an edge triggered D-Latch. Results show that evolve...
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ISLPED
1997
ACM
13 years 10 months ago
1997
ACM
A new statistical technique for average power estimation in sequential circuits is presented. Due to the feedback mechanism, conventional statistical procedures cannot be applied ...
EH
2004
IEEE
13 years 10 months ago
2004
IEEE
This paper describes a system that is robust with respect to sensor failure. The system utilizes multiple sensor inputs (three in this case) connected to a programmable device (FP...