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DAC
2009
ACM
16 years 7 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2004
ACM
16 years 7 months ago
Efficient power/ground network analysis for power integrity-driven design methodology
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...
Su-Wei Wu, Yao-Wen Chang
ISQED
2009
IEEE
187views Hardware» more  ISQED 2009»
16 years 29 days ago
An efficient current-based logic cell model for crosstalk delay analysis
 Electrical Modeling for High Bandwidth IO Link  Chirayu Amin, Chandramouli Kashyap ¬ Intel Corp., Hillsboro, OR  Prateek Bhansali ¬ Univ. of Minnesota, Mi...
Debasish Das, William Scott, Shahin Nazarian, Hai ...
170
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AMAST
2008
Springer
15 years 8 months ago
A Formal Analysis of Complex Type Flaw Attacks on Security Protocols
A simple type confusion attack occurs in a security protocol, when a principal interprets data of one type as data of another. These attacks can be successfully prevented by \taggi...
Han Gao, Chiara Bodei, Pierpaolo Degano
SIGOPS
2010
162views more  SIGOPS 2010»
15 years 4 months ago
Visual and algorithmic tooling for system trace analysis: a case study
Despite advances in the application of automated statistical and machine learning techniques to system log and trace data there will always be a need for human analysis of machine...
Wim De Pauw, Steve Heisig