1112 search results - page 76 / 223 » Executing Abstract Test Cases |
119
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ISVLSI
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
121
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JCP
2007
15 years 2 months ago
2007
Abstract— As the technologies of autonomic computing become more prevalent, it is essential to develop methodologies for testing their dynamic self-management operations. Self-ma...
139
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EDCC
2005
Springer
15 years 8 months ago
2005
Springer
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
110
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TACAS
2009
Springer
15 years 9 months ago
2009
Springer
We describe the design and implementation of an automatic invariant generator for imperative programs. While automatic invariant generation through constraint solving has been exte...
110
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DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...