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    NETWORKING
    2008
    130views Computer Networks» more  NETWORKING 2008»
    XIAN Automated Management and Nano-Protocol to Design Cross-Layer Metrics for Ad Hoc Networking
    14 years 11 months ago
    XIAN Automated Management and Nano-Protocol to Design Cross-Layer Metrics for Ad Hoc Networking
    Download  xian.sourceforge.net
    In the highly dynamic and unpredictable environment of MANETs, cross-layer design is receiving growing interest but lacks experimental validation tools. This paper presents XIAN (C...
    Hervé Aïache, Vania Conan, Laure Lebru...
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    ISUVR
    2007
    121views Virtual Reality» more  ISUVR 2007»
    Virtual Reality in Ubiquitous Computing Environment
    14 years 11 months ago
    Virtual Reality in Ubiquitous Computing Environment
    Download  sunsite.informatik.rwth-aachen.de
    —In this paper, we propose a novel concept of Ubiquitous Virtual Reality (U-VR) and examine technical challenges to be required for realizing it. It is difficult to realize Virtu...
    Youngjung Suh, Kiyoung Kim, JoungHyun Han, Woontac...
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    MASCOTS
    2007
    93views Modeling And Simulation» more  MASCOTS 2007»
    Nine months in the life of EGEE: a look from the South
    14 years 11 months ago
    Nine months in the life of EGEE: a look from the South
    Download  www.cs.ucy.ac.cy
    Abstract— Grids have emerged as wide-scale, distributed infrastructures providing enough resources for always more demanding scientific experiments. EGEE is one of the largest s...
    Georges Da Costa, Marios D. Dikaiakos, Salvatore O...
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    MVA
    2007
    119views Computer Vision» more  MVA 2007»
    Wavelet-Based Multiresolution Features for Detecting Duplications in Images
    14 years 11 months ago
    Wavelet-Based Multiresolution Features for Detecting Duplications in Images
    Download  www.cvl.iis.u-tokyo.ac.jp
    Duplication of image regions is a common method for manipulating original images using typical software like Adobe Photoshop. In this study, we propose a wavelet based feature rep...
    Md. Khayrul Bashar, Keiji Noda, Noboru Ohnishi, Hi...
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    SPLC
    2008
    144views Software Engineering» more  SPLC 2008»
    Automated Diagnosis of Product-Line Configuration Errors in Feature Models
    14 years 11 months ago
    Automated Diagnosis of Product-Line Configuration Errors in Feature Models
    Download  www.dre.vanderbilt.edu
    Feature models are widely used to model software product-line (SPL) variability. SPL variants are configured by selecting feature sets that satisfy feature model constraints. Conf...
    Jules White, Douglas C. Schmidt, David Benavides, ...
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