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» Experimental Models for Validating Technology
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127
Voted
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 8 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
126
Voted
ISLPED
1998
ACM
94views Hardware» more  ISLPED 1998»
15 years 8 months ago
Theoretical bounds for switching activity analysis in finite-state machines
- The objective of this paper is to provide lower and upper bounds for the switching activity on the state lines in Finite State Machines (FSMs). Using a Markov chain model for the...
Diana Marculescu, Radu Marculescu, Massoud Pedram
DAC
1995
ACM
15 years 7 months ago
Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits
Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
Farid N. Najm, Michael Y. Zhang
WSC
2007
15 years 6 months ago
Simulation results and formalism for global-local scheduling in semiconductor manufacturing facilities
This article deals with an approach for managing scheduling in semiconductor manufacturing facilities. The proposed approach ensures consistency between global and local schedulin...
Mickaël Bureau, Stéphane Dauzèr...
CORR
2008
Springer
97views Education» more  CORR 2008»
15 years 4 months ago
Self-Motions of General 3-RPR Planar Parallel Robots
We study the kinematic geometry of general 3-RPR planar parallel robots with actuated base joints. These robots, while largely overlooked, have simple direct kinematics and large ...
Sébastien Briot, Ilian A. Bonev, Damien Cha...