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IOLTS
2007
IEEE
14 years 17 days ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
CASES
2006
ACM
14 years 7 days ago
2006
ACM
Dynamic voltage scaling and sleep state control have been shown to be extremely effective in reducing energy consumption in CMOS circuits. Though plenty of research papers have st...
SAC
2011
ACM
12 years 9 months ago
2011
ACM
Regression testing is often performed with a time budget and it does not allow executing all test cases. Test case prioritization techniques re-order test cases to increase the ra...