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94
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ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
15 years 4 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
118
Voted
INFSOF
2007
148views more  INFSOF 2007»
15 years 21 days ago
Mutating database queries
A set of mutation operators for SQL queries that retrieve information from a database is developed and tested against a set of queries drawn from the NIST SQL Conformance Test Sui...
Javier Tuya, María José Suáre...
89
Voted
DAC
1997
ACM
15 years 5 months ago
Frequency-Domain Compatibility in Digital Filter BIST
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
Laurence Goodby, Alex Orailoglu
104
Voted
ICSEA
2007
IEEE
15 years 7 months ago
Test Data Generation from UML State Machine Diagrams using GAs
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir...
107
Voted
AOSD
2006
ACM
15 years 6 months ago
A framework and tool supports for generating test inputs of AspectJ programs
Aspect-oriented software development is gaining popularity with the wider adoption of languages such as AspectJ. To reduce the manual effort of testing aspects in AspectJ programs...
Tao Xie, Jianjun Zhao