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ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
15 years 10 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
KBSE
2005
IEEE
15 years 6 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
ACSAC
2010
IEEE
14 years 11 months ago
Multi-vendor penetration testing in the advanced metering infrastructure
- The advanced metering infrastructure (AMI) is revolutionizing electrical grids. Intelligent AMI "smart meters" report real time usage data that enables efficient energy...
Stephen E. McLaughlin, Dmitry Podkuiko, Sergei Mia...
SIGSOFT
2008
ACM
16 years 1 months ago
Profile-guided program simplification for effective testing and analysis
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
Lingxiao Jiang, Zhendong Su
KDD
2006
ACM
156views Data Mining» more  KDD 2006»
16 years 1 months ago
Detecting outliers using transduction and statistical testing
Outlier detection can uncover malicious behavior in fields like intrusion detection and fraud analysis. Although there has been a significant amount of work in outlier detection, ...
Daniel Barbará, Carlotta Domeniconi, James ...