3639 search results - page 76 / 728 » Experiments on IPv6 Testing |
GLVLSI
2007
IEEE
15 years 7 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
DATE
2003
IEEE
15 years 6 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
114
Voted
CSEE
2006
Springer
15 years 2 months ago
2006
Springer
Test-driven development (TDD) is an agile software development strategy that addresses both design and testing. This paper describes a controlled experiment that examines the effe...
86
Voted
ICSE
2003
IEEE-ACM
16 years 23 days ago
2003
IEEE-ACM
Web applications have become critical components of the global information infrastructure, and it is important that they be validated to ensure their reliability. Therefore, many ...
97
Voted
WSDM
2010
ACM
15 years 10 months ago
2010
ACM
While test collection construction is a time-consuming and expensive process, the true cost is amortized by reusing the collection over hundreds or thousands of experiments. Some ...