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95
Voted
ITC
1996
IEEE
15 years 4 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
85
Voted
COR
2006
15 years 22 days ago
2006
-- The purpose of this paper is to describe the implementation and testing of the tabu cycle method and two variants of the conditional probability method. These methods were origi...
108
Voted
SIAMCO
2008
15 years 18 days ago
2008
We investigate the asymptotic properties of a recursive kernel density estimator associated with the driven noise of a linear regression in adaptive tracking. We provide an almost ...
SIGPRO
2002
15 years 10 days ago
2002
In this paper, we investigate applicability of statistical techniques for defect detection in radiographic images of welds. The defect detection procedure consists in a statistica...
100
click to vote
ISSTA
2010
ACM
15 years 4 months ago
2010
ACM
When developers change a program, regression tests can fail not only due to faults in the program but also due to outof-date test code that does not reflect the desired behavior ...