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ICCAD
2005
IEEE
106views Hardware» more  ICCAD 2005»
15 years 6 months ago
FPGA device and architecture evaluation considering process variations
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He
ICARIS
2003
Springer
15 years 2 months ago
A Randomized Real-Valued Negative Selection Algorithm
This paper presents a real-valued negative selection algorithm with good mathematical foundation that solves some of the drawbacks of our previous approach [11]. Specifically, it ...
Fabio A. González, Dipankar Dasgupta, Luis ...
WSC
1998
14 years 11 months ago
A Parametric Version of Jackknife-after-Bootstrap
In this paper, we investigate the problem of deriving precision estimates for bootstrap quantities within parametric families. Efron's [1992] jackknife-after-bootstrap is a s...
Jin Wang
CSDA
2007
92views more  CSDA 2007»
14 years 9 months ago
On the estimation of the linear relation when the error variances are known
The problem of consistent estimation in measurement error models in a linear relation with not necessarily normally distributed measurement errors is considered. Three possible es...
H. Schneeweiss, H. Shalabh
JC
2006
86views more  JC 2006»
14 years 9 months ago
Randomly shifted lattice rules for unbounded integrands
We study the problem of multivariate integration over Rd with integrands of the form f(x)d(x) where d is a probability density function. Practical problems of this form occur comm...
Frances Y. Kuo, Grzegorz W. Wasilkowski, Benjamin ...