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ICCAD
2005
IEEE
106views Hardware» more  ICCAD 2005»
15 years 8 months ago
FPGA device and architecture evaluation considering process variations
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He
ICARIS
2003
Springer
15 years 5 months ago
A Randomized Real-Valued Negative Selection Algorithm
This paper presents a real-valued negative selection algorithm with good mathematical foundation that solves some of the drawbacks of our previous approach [11]. Specifically, it ...
Fabio A. González, Dipankar Dasgupta, Luis ...
WSC
1998
15 years 1 months ago
A Parametric Version of Jackknife-after-Bootstrap
In this paper, we investigate the problem of deriving precision estimates for bootstrap quantities within parametric families. Efron's [1992] jackknife-after-bootstrap is a s...
Jin Wang
CSDA
2007
92views more  CSDA 2007»
14 years 11 months ago
On the estimation of the linear relation when the error variances are known
The problem of consistent estimation in measurement error models in a linear relation with not necessarily normally distributed measurement errors is considered. Three possible es...
H. Schneeweiss, H. Shalabh
JC
2006
86views more  JC 2006»
14 years 11 months ago
Randomly shifted lattice rules for unbounded integrands
We study the problem of multivariate integration over Rd with integrands of the form f(x)d(x) where d is a probability density function. Practical problems of this form occur comm...
Frances Y. Kuo, Grzegorz W. Wasilkowski, Benjamin ...