An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Since the first results published in 1973 by Liu and Layland on the Rate Monotonic (RM) and Earliest Deadline First (EDF) algorithms, a lot of progress has been made in the schedu...
A technique for detecting scene changes in compressed video streams is proposed which combines multiple modes of information. The proposed technique directly exploits and combines ...
Suchendra M. Bhandarkar, Yashodhan S. Warke, Aparn...
We consider the problem of estimating CPU (distance computations) and I/O costs for processing range and k-nearest neighbors queries over metric spaces. Unlike the specific case ...
In Wirth t Reinartz (1996), we introduced the early indicator method, a multi-strategy approach for the efficient prediction of various aspectsof the fault profile of a set of car...