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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
The power density inside high performance systems continues to rise with every process technology generation, thereby increasing the operating temperature and creating “hot spot...
DSD
2006
IEEE
15 years 10 months ago
2006
IEEE
149
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DSN
2006
IEEE
15 years 10 months ago
2006
IEEE
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
HICSS
2006
IEEE
15 years 10 months ago
2006
IEEE
104
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HICSS
2006
IEEE
15 years 10 months ago
2006
IEEE
