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126
Voted
ASPDAC
2007
ACM
15 years 5 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
203
Voted
CVPR
2006
IEEE
16 years 3 months ago
2006
IEEE
SIFT has been proven to be the most robust local invariant feature descriptor. SIFT is designed mainly for gray images. However, color provides valuable information in object desc...
105
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IPPS
2006
IEEE
15 years 8 months ago
2006
IEEE
— This paper describes work in progress to extend component models to support Master-Worker applications and to let them to be executed on Grid infrastructures. The proposed appr...
115
Voted
AIIA
2005
Springer
15 years 7 months ago
2005
Springer
Given Boolean data sets which record properties of objects, Formal Concept Analysis is a well-known approach for knowledge discovery. Recent application domains, e.g., for very lar...
VISUALIZATION
2002
IEEE
15 years 6 months ago
2002
IEEE
We present a novel disk-based multiresolution triangle mesh data structure that supports paging and view-dependent rendering of very large meshes at interactive frame rates from e...