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» Extended First-Order Logic
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CP
1998
Springer
15 years 2 months ago
Generation of Test Patterns for Differential Diagnosis of Digital Circuits
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
Francisco Azevedo, Pedro Barahona
FPGA
1997
ACM
145views FPGA» more  FPGA 1997»
15 years 1 months ago
Generation of Synthetic Sequential Benchmark Circuits
Programmable logic architectures increase in capacity before commercial circuits are designed for them, yielding a distinct problem for FPGA vendors: how to test and evaluate the ...
Michael D. Hutton, Jonathan Rose, Derek G. Corneil
MICRO
1994
IEEE
96views Hardware» more  MICRO 1994»
15 years 1 months ago
A fill-unit approach to multiple instruction issue
Multiple issue of instructions occurs in superscalar and VLIW machines. This paper investigates a third type of machine design, which combines the advantages of code compatibility...
Manoj Franklin, Mark Smotherman
GIS
1992
ACM
15 years 1 months ago
Machine Induction of Geospatial Knowledge
Machine learning techniques such as tree induction have become accepted tools for developing generalisations of large data sets, typically for use with production rule systems in p...
Peter A. Whigham, Robert I. McKay, J. R. Davis
BIRTHDAY
2009
Springer
15 years 1 months ago
Modular Verification of Strongly Invasive Aspects
An extended specification for aspects, and a new verification method based on model checking are used to establish the correctness of strongly-invasive aspects, independently of a...
Emilia Katz, Shmuel Katz