1879 search results - page 130 / 376 » Extending Reflective Architectures |
146
click to vote
ACL
2006
15 years 5 months ago
2006
The LOGON MT demonstrator assembles independently valuable general-purpose NLP components into a machine translation pipeline that capitalizes on output quality. The demonstrator ...
162
click to vote
HPCA
2007
IEEE
16 years 4 months ago
2007
IEEE
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
113
click to vote
SIGCOMM
2009
ACM
15 years 10 months ago
2009
ACM
Application-independent Redundancy Elimination (RE), or identifying and removing repeated content from network transfers, has been used with great success for improving network pe...
168
click to vote
ATS
1998
IEEE
15 years 8 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
127
click to vote
DPHOTO
2010
15 years 5 months ago
2010
Recent research demonstrates the advantage of designing electro-optical imaging systems by jointly optimizing the optical and digital subsystems. The optical systems designed usin...