Present application specific embedded systems tend to choose instruction set extensions (ISEs) based on limitations imposed by the available data bandwidth to custom functional un...
Panagiotis Athanasopoulos, Philip Brisk, Yusuf Leb...
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
Continuing improvements in semiconductor density are enabling new classes of System-on-a-Chip architectures that combine extensive processing logic and high-density memory. Many o...
David L. Landis, Paul T. Hulina, Scott Deno, Luke ...
Mining frequent itemsets is at the core of mining association rules, and is by now quite well understood algorithmically for main memory databases. In this paper, we investigate a...