8 search results - page 2 / 2 » Extraction of Gate Level Models from Transistor Circuits by ... |
DAC
2008
ACM
14 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
FTEDA
2006
13 years 6 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
ICCAD
2002
IEEE
14 years 3 months ago
2002
IEEE
As the scale of system integration continues to grow, the on-chip communication becomes the ultimate bottleneck of system performance and the primary determinant of system archite...