298 search results - page 44 / 60 » Extractors for circuit sources |
ETS
2009
IEEE
14 years 9 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
TE
2010
14 years 6 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
117
click to vote
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
In this paper, we present a novel simulation approach for power grid network analysis. The new approach, called ETBR for extended truncated balanced realization, is based on model...
113
click to vote
VTS
2000
IEEE
15 years 4 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
DAC
2005
ACM
15 years 1 months ago
2005
ACM
Although a lot of research efforts have been made in the minimization of the total power consumption caused by the clock tree, no attention has been paid to the minimization of th...