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DATE
2002
IEEE
169views Hardware» more  DATE 2002»
15 years 9 months ago
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics
There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible...
Yolanda Lechuga, Román Mozuelos, Mar Mart&i...
ICCD
2002
IEEE
122views Hardware» more  ICCD 2002»
15 years 9 months ago
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
Sule Ozev, Alex Orailoglu
ICPR
2002
IEEE
15 years 9 months ago
Determining a Suitable Metric when Using Non-Negative Matrix Factorization
The Non-negative Matrix Factorization technique (NMF) has been recently proposed for dimensionality reduction. NMF is capable to produce a region- or partbased representation of o...
David Guillamet, Jordi Vitrià
ICPR
2002
IEEE
15 years 9 months ago
Using Eigen-Deformations in Handwritten Character Recognition
Deformations in handwritten characters have classdependent tendencies. For example, characters of class “A” are often deformed by global slant transformation and never deforme...
Seiichi Uchida, Mohammad Asad Ronee, Hiroaki Sakoe
ITC
2002
IEEE
112views Hardware» more  ITC 2002»
15 years 9 months ago
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
David B. Lavo, Ismed Hartanto, Tracy Larrabee