An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
Simeon Realov, William McLaughlin, Kenneth L. Shep...
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
—Privacy protection is increasingly important during authentications in Radio Frequency Identification (RFID) systems. In order to achieve high-speed authentication in largescale...
Remote sensing of terrain characteristics is an important component for autonomous operation of mobile robots in natural terrain. Often this involves classification of terrain int...
— Despite their success as optimization methods, evolutionary algorithms face many difficulties to design artifacts with complex structures. According to paleontologists, living...