568 search results - page 62 / 114 » FAST - An Automatic Generation System for Grammar Tests |
ICPR
2004
IEEE
15 years 11 months ago
2004
IEEE
ACT Maps are vital tools for most government agencies and consumers. However, their manual generation and updating is tedious and time consuming. As a step toward automatic map gen...
GECCO
2008
Springer
14 years 10 months ago
2008
Springer
Genetic-Based Machine Learning Systems (GBML) are comparable in accuracy with other learning methods. However, efficiency is a significant drawback. This paper presents a new rep...
ISSTA
2006
ACM
15 years 3 months ago
2006
ACM
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
ASWEC
2007
IEEE
15 years 1 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
ICST
2008
IEEE
15 years 4 months ago
2008
IEEE
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...