568 search results - page 80 / 114 » FAST - An Automatic Generation System for Grammar Tests |
SENSYS
2009
ACM
15 years 4 months ago
2009
ACM
Continuous and reliable operation of WSNs is notoriously difficult to guarantee due to hardware degradation and environmental changes. In this paper, we propose and demonstrate a ...
IPSN
2005
Springer
15 years 3 months ago
2005
Springer
—We describe the development of a set of embedded system building blocks, known as eBlocks. An eBlock network can be viewed as a basic form of sensor network that can be develope...
ICIP
1999
IEEE
15 years 11 months ago
1999
IEEE
An integral scheme that provides a global eigen approach to the problem of face recognition of still images has been presented in [1]. The scheme is based on the representation of...
DSN
2009
IEEE
15 years 4 months ago
2009
IEEE
Fault injection, a critical aspect of testing robust systems, is often overlooked in the development of generalpurpose software. We believe this is due to the absence of easy-to-u...
ESCIENCE
2006
IEEE
15 years 3 months ago
2006
IEEE
Grid software developers and Grid site administrators both require realistic testbeds where they can test applications and middleware before deployment on production infrastructur...