2476 search results - page 389 / 496 » Faceted Knowledge Representation |
ICCAD
2007
IEEE
15 years 6 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
IUI
2009
ACM
15 years 6 months ago
2009
ACM
Concept maps are an important tool to knowledge organization, representation, and sharing. Most current concept map tools do not provide full support for hand-drawn concept map cr...
IUI
2009
ACM
15 years 6 months ago
2009
ACM
Using content-specific models to guide information retrieval and extraction can provide richer interfaces to endusers for both understanding the context of news events and navigat...
TACAS
2010
Springer
15 years 4 months ago
2010
Springer
Boolean satisfiability (SAT) and its extensions are becoming a core technology for the analysis of systems. The SAT-based approach divides into three steps: encoding, preprocessin...