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DAC
2008
ACM
15 years 10 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
WWW
2008
ACM
15 years 10 months ago
Action science approach to nonprofit housing services using web 2.0 mapping tools
The study follows action science approach to the problem of nonprofit housing services. After 4 months of action sciencebased activities, such as organized participant observation...
Yao-Jen Chang, Hsin-Yu Hsu, Tsen-Yung Wang
KDD
2006
ACM
142views Data Mining» more  KDD 2006»
15 years 10 months ago
Mining distance-based outliers from large databases in any metric space
Let R be a set of objects. An object o R is an outlier, if there exist less than k objects in R whose distances to o are at most r. The values of k, r, and the distance metric ar...
Yufei Tao, Xiaokui Xiao, Shuigeng Zhou
VLSID
2002
IEEE
136views VLSI» more  VLSID 2002»
15 years 10 months ago
Buffered Routing Tree Construction under Buffer Placement Blockages
Interconnect delay has become a critical factor in determining the performance of integrated circuits. Routing and buffering are powerful means of improving the circuit speed and ...
Wei Chen, Massoud Pedram, Premal Buch
VLDB
2007
ACM
94views Database» more  VLDB 2007»
15 years 10 months ago
Deadline and QoS Aware Data Warehouse
Data Warehouses and Business Intelligence (BI) applications are the top two priorities for CIO/CTOs (Celent report on December 14, 2005). A data warehouse IT infrastructure needs ...
Wen-Syan Li, Dengfeng Gao, Rafae Bhatti, Inderpal ...