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110
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GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
15 years 6 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
125
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PDPTA
2010
15 years 19 days ago
Collecting Sensor Data for High-Performance Computing: A Case-study
- Many research questions remain open with regard to improving reliability in exascale systems. Among others, statistics-based analysis has been used to find anomalies, to isolate ...
Line C. Pouchard, Jonathan D. Dobson, Stephen W. P...
133
Voted
ASPLOS
2010
ACM
15 years 9 months ago
SherLog: error diagnosis by connecting clues from run-time logs
Computer systems often fail due to many factors such as software bugs or administrator errors. Diagnosing such production run failures is an important but challenging task since i...
Ding Yuan, Haohui Mai, Weiwei Xiong, Lin Tan, Yuan...
150
Voted
RTAS
2010
IEEE
15 years 18 days ago
Middleware for Resource-Aware Deployment and Configuration of Fault-Tolerant Real-time Systems
Developing large-scale distributed real-time and embedded (DRE) systems is hard in part due to complex deployment and configuration issues involved in satisfying multiple quality f...
Jaiganesh Balasubramanian, Aniruddha S. Gokhale, A...
147
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GLOBECOM
2008
IEEE
15 years 2 months ago
Security Rules Specification and Analysis Based on Passive Testing
Security is a critical issue in dynamic and open distributed environments such as network-based services or wireless networks. To ensure that a certain level of security is maintai...
Wissam Mallouli, Fayçal Bessayah, Ana R. Ca...