69 search results - page 5 / 14 » Fast Estimation of Timing Yield Bounds for Process Variation... |
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
TIT
2002
14 years 9 months ago
2002
We consider the estimation of the order, i.e., the number of hidden states, of a special class of discrete-time finite-alphabet hidden Markov sources. This class can be characteriz...
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
DAC
2010
ACM
14 years 9 months ago
2010
ACM
We study diagnosis of segments on speedpaths that fail the timing constraint at the post-silicon stage due to manufacturing variations. We propose a formal procedure that is appli...