69 search results - page 7 / 14 » Fast Estimation of Timing Yield Bounds for Process Variation... |
WAW
2010
Springer
14 years 7 months ago
2010
Springer
Abstract. Motivated by social network data mining problems such as link prediction and collaborative filtering, significant research effort has been devoted to computing topologica...
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ISBI
2004
IEEE
15 years 10 months ago
2004
IEEE
We present a fully four-dimensional, globally convergent, incremental gradient algorithm to estimate the continuous-time tracer density from list mode positron emission tomography...
ASPDAC
2010
ACM
14 years 7 months ago
2010
ACM
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
FTEDA
2006
14 years 9 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
JSAC
2006
14 years 9 months ago
2006
Abstract--This work presents a channel model for the broadband characterization of power lines in presence of time variation of the loads. The model is characterized by taking into...