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DFT
2002
IEEE
117views VLSI» more  DFT 2002»
16 years 2 days ago
Fast and Energy-Frugal Deterministic Test Through Test Vector Correlation Exploitation
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
Ozgur Sinanoglu, Alex Orailoglu
FCCM
2002
IEEE
127views VLSI» more  FCCM 2002»
16 years 2 days ago
Hardware-Assisted Fast Routing
To fully realize the benefits of partial and rapid reconfiguration of field-programmable devices, we often need to dynamically schedule computing tasks and generate instance-sp...
André DeHon, Randy Huang, John Wawrzynek
GLVLSI
2002
IEEE
103views VLSI» more  GLVLSI 2002»
16 years 2 days ago
Fast and accurate wire delay estimation for physical synthesis of large ASICs
Ruchir Puri, David S. Kung, Anthony D. Drumm
ICARCV
2002
IEEE
153views Robotics» more  ICARCV 2002»
16 years 2 days ago
Fast, unconstrained camera motion estimation from stereo without tracking and robust statistics
Camera motion estimation is useful for a range of applications. Usually, feature tracking is performed through the sequence of images to determine correspondences. Furthermore, ro...
Heiko Hirschmüller, Peter R. Innocent, Jonath...