143 search results - page 1 / 29 » Fast Line-Based Imaging of Small Sample Features |
101
Voted
ICASSP
2007
IEEE
15 years 10 months ago
2007
IEEE
This project aims to reduce the time required to attain more detailed scans of small interesting regions present in a quick first-pass sample image. In particular, we concentrate...
168
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JMLR
2012
13 years 6 months ago
2012
We study the prevalent problem when a test distribution differs from the training distribution. We consider a setting where our training set consists of a small number of sample d...
101
Voted
CIVR
2009
Springer
15 years 10 months ago
2009
Springer
136
Voted
CVPR
2008
IEEE
16 years 5 months ago
2008
IEEE
In this paper, we present a novel iris recognition method based on learned ordinal features.Firstly, taking full advantages of the properties of iris textures, a new iris represen...
129
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CVPR
2010
IEEE
15 years 4 months ago
2010
IEEE
This paper presents region moments, a class of appearance descriptors based on image moments applied to a pool of image features. A careful design of the moments and the image fea...