32 search results - page 6 / 7 » Fast Sequential Circuit Test Generation Using High-Level and... |
ICCAD
2009
IEEE
13 years 4 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
TEC
2002
13 years 5 months ago
2002
Abstract--In this paper, we present an efficient graph-based evolutionary optimization technique called evolutionary graph generation (EGG) and the proposed approach is applied to ...
ICCAD
1999
IEEE
13 years 10 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
IEEEARES
2006
IEEE
14 years 9 days ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
PAMI
2010
13 years 4 months ago
2010
—In this paper, we present novel techniques that improve the computational and memory efficiency of algorithms for solving multi-label energy functions arising from discrete MRF...